Počet záznamů: 1
Supersensitive surface imaging with very slow secondary electrons
- 1.0482727 - ÚPT 2018 KR eng A - Abstrakt
Mikmeková, Šárka - Konvalina, Ivo - Tsukiori, D. - Arai, R. - Takano, M. - Okuda, K. - Müllerová, Ilona - Frank, Luděk
Supersensitive surface imaging with very slow secondary electrons.
The 3rd East-Asia Microscopy Conference. Abstract Proceeding. Seoul: Korean Society of Microscopy, 2017.
[East-Asia Microscopy Conference /3./. 07.11.2017-10.11.2017, Busan]
Institucionální podpora: RVO:68081731
Klíčová slova: supersensitive surface * very slow secondary electrons
Obor OECD: Materials engineering
Trvalý link: http://hdl.handle.net/11104/0278110
Počet záznamů: 1