Kopeček, Jaromír - Jurek, Karel - Kopecký, Vít - Klimša, Ladislav - Seiner, Hanuš - Sedlák, Petr - Landa, Michal - Dluhoš, J. - Petrenec, M. - Hladík, L. - Doupal, A. - Heczko, Oleg
Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl.
Microscopy and Microanalysis. Roč. 20, Aug (2014), s. 335-336. ISSN 1431-9276. E-ISSN 1435-8115
R&D Projects: GA ČR(CZ) GA14-03044S
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 1.872, year: 2014 ; AIS: 0.793, rok: 2014
DOI: https://doi.org/10.1017/S1431927614003390
http://hdl.handle.net/11104/0277259