Počet záznamů: 1  

Energy loss and online directional track visualization of fast electrons with the pixel detector Timepix

  1. 1.
    SYSNO ASEP0424873
    Druh ASEPJ - Článek v odborném periodiku
    Zařazení RIVJ - Článek v odborném periodiku
    Poddruh JČlánek ve WOS
    NázevEnergy loss and online directional track visualization of fast electrons with the pixel detector Timepix
    Tvůrce(i) Granja, C. (CZ)
    Krist, Pavel (UJF-V) RID, ORCID, SAI
    Chvátil, David (UJF-V) RID, SAI, ORCID
    Šolc, J. (CZ)
    Pospíšil, S. (CZ)
    Jakubek, J. (CZ)
    Opalka, L. (CZ)
    Celkový počet autorů7
    Zdroj.dok.Radiation Measurements. - : Elsevier - ISSN 1350-4487
    Roč. 59, DEC (2013), s. 245-261
    Poč.str.17 s.
    Forma vydáníTištěná - P
    Jazyk dok.eng - angličtina
    Země vyd.GB - Velká Británie
    Klíč. slovainteraction of radiation with matter ; dE/dx detectors ; particle tracking detectors ; hybrid pixel detectors ; active nuclear emulsion ; energy loss
    Vědní obor RIVBG - Jaderná, atomová a mol. fyzika, urychlovače
    Institucionální podporaUJF-V - RVO:61389005
    UT WOS000329421700039
    EID SCOPUS84889095051
    DOI10.1016/j.radmeas.2013.07.006
    AnotaceThe spectral-, position- and tracking-response of Timepix to energetic electrons has been tested and characterized with well-defined low-intensity parallel beams of monoenergetic electrons in the 7 -21 MeV range. The per-pixel energy sensitivity of Timepix serves as a position-sensitive dE/dx detector to determine the energy loss over along the particle track. The sampling path pitch can be set to 55 mu m (pixel-size) and arbitrary values between 300 mu m (sensor thickness) and nearly 2 mm. Timepix can register and visualize not only the position and trajectories but also the direction of trajectories and the rate of directional scattering of single fast electrons across the semiconductor sensor. The technique serves to measure the spatial distribution of a parallel beam, the beam size spread, transversal beam flux homogeneity and lateral straggling at the pixel-size scale. The mean scattering path along the beam axis and the mean path for lateral beam straggling in silicon can be determined. Measured energy loss distributions were compared with model and previous data as well as with dedicated Monte Carlo MCNPX simulations performed for this work. Tracking distributions were also simulated.
    PracovištěÚstav jaderné fyziky
    KontaktMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Rok sběru2014
Počet záznamů: 1  

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