Počet záznamů: 1
The precise refractive index of air measuring unit suitable for metrological scanning probe microscope
- 1.Hucl, Václav - Čížek, Martin - Buchta, Zdeněk - Mikel, Břetislav - Lazar, Josef - Číp, Ondřej
The precise refractive index of air measuring unit suitable for metrological scanning probe microscope.
NanoScale 2013. 10th Seminar on Quantitative Microscopy (QM) and 6th Seminar on Nanoscale Calibration Standards and methods.. Paris: Nanometrology Group, 2013, s. 109.
[NanoScale 2013. Seminar on Quantitative Microscopy (QM) /10./ and Seminar on Nanoscale Calibration Standards and Methods /6./. Paris (FR), 25.04.2013-26.04.2013]
http://hdl.handle.net/11104/0228283
Počet záznamů: 1