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The precise refractive index of air measuring unit suitable for metrological scanning probe microscope
- 1.Hucl, V., Čížek, M., Buchta, Z., Mikel, B., Lazar, J., Číp, O. The precise refractive index of air measuring unit suitable for metrological scanning probe microscope. In: NanoScale 2013. 10th Seminar on Quantitative Microscopy (QM) and 6th Seminar on Nanoscale Calibration Standards and methods. Paris: Nanometrology Group, 2013, s. 109.
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