The precise refractive index of air measuring unit suitable for metrological scanning probe microscope

HUCL, V., ČÍŽEK, M., BUCHTA, Z., MIKEL, B., LAZAR, J., ČÍP, O. The precise refractive index of air measuring unit suitable for metrological scanning probe microscope. In: NanoScale 2013. 10th Seminar on Quantitative Microscopy (QM) and 6th Seminar on Nanoscale Calibration Standards and methods. Paris: Nanometrology Group, 2013, s. 109.