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The precise refractive index of air measuring unit suitable for metrological scanning probe microscope
- 1.HUCL, Václav, ČÍŽEK, Martin, BUCHTA, Zdeněk, MIKEL, Břetislav, LAZAR, Josef, ČÍP, Ondřej. The precise refractive index of air measuring unit suitable for metrological scanning probe microscope. In: NanoScale 2013. 10th Seminar on Quantitative Microscopy (QM) and 6th Seminar on Nanoscale Calibration Standards and methods. Paris: Nanometrology Group, 2013, s. 109.
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