Microcrystalline silicon thin films studied by photoconductive atomic force microscopy

Počet záznamů: 1

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SYSNO	0390947
Název	Microcrystalline silicon thin films studied by photoconductive atomic force microscopy
Tvůrce(i)	Ledinský, Martin (FZU-D)_{RID, ORCID, SAI} Vetushka, Aliaksi (FZU-D)_{RID, ORCID} Stuchlík, Jiří (FZU-D)_{RID, ORCID} Rezek, Bohuslav (FZU-D)_{RID, ORCID} Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Zdroj.dok.	ICANS 24. Program and Abstracts Book. S. 233-233. - Nara, 2011
Konference	International Conference on Amorphous and Nanocrystalline Semiconductors /24./ - ICANS 24, Nara, 21.08.2011-26.08.2011
Druh dok.	Abstrakt
CEZ	AV0Z10100521 - FZU-D (2005-2011)
Jazyk dok.	eng
Země vyd.	JP
Klíč.slova	amorphous silicon * nanocrystalline silicon * thin films * atomic force microscopy * photoconductivity
Trvalý link	http://hdl.handle.net/11104/0219806

Počet záznamů: 1