Počet záznamů: 1
Structure of mixed-phase Si films studied by C-AFM and X-TEM
- 1.Mates, Tomáš - Bronsveld, P.C.P. - Fejfar, Antonín - Rezek, Bohuslav - Kočka, Jan - Rath, J.K. - Schropp, R.E.I.
Structure of mixed-phase Si films studied by C-AFM and X-TEM.
Journal of Physics: Conference Series. Roč. 61, - (2007), s. 790-794. ISSN 1742-6588. E-ISSN 1742-6596
http://hdl.handle.net/11104/0184793
Počet záznamů: 1