Počet záznamů: 1
Structure of mixed-phase Si films studied by C-AFM and X-TEM
- 1.Mates, T., Bronsveld, P.C.P., Fejfar, A., Rezek, B., Kočka, J., Rath, J.K., Schropp, R.E.I. Structure of mixed-phase Si films studied by C-AFM and X-TEM. Journal of Physics: Conference Series. 2007, 61(-), 790-794. ISSN 1742-6588. E-ISSN 1742-6596.
Počet záznamů: 1