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Structure of mixed-phase Si films studied by C-AFM and X-TEM
- 1.MATES, Tomáš, BRONSVELD, P.C.P., FEJFAR, Antonín, REZEK, Bohuslav, KOČKA, Jan, RATH, J.K., SCHROPP, R.E.I. Structure of mixed-phase Si films studied by C-AFM and X-TEM. Journal of Physics: Conference Series. 2007, 61(-), 790-794. ISSN 1742-6588. E-ISSN 1742-6596.
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