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The effect of annealing of Eu:Y2O3/alumina nanostructures thin film
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SYSNO ASEP 0340027 Druh ASEP A - Abstrakt Zařazení RIV Záznam nebyl označen do RIV Zařazení RIV Není vybrán druh dokumentu Název The effect of annealing of Eu:Y2O3/alumina nanostructures thin film Tvůrce(i) Lančok, Ján (FZU-D) RID, ORCID
Novotný, Michal (FZU-D) RID, ORCID, SAI
Bulíř, Jiří (FZU-D) RID, ORCID, SAI
Garapon, C. (FR)
Martinet, C. (FR)
Guy, S. (FR)
Klementová, Mariana (FZU-D) RID, ORCIDZdroj.dok. E-MRS 2008 Spring Meeting, Symposium B. - Warrendale, PA : MRS, 2008 - ISBN N
BP125Poč.str. 1 s. Akce E-MRS 2008 Spring Meeting Datum konání 26.05.2008-30.05.2008 Místo konání Strasbourg Země FR - Francie Typ akce WRD Jazyk dok. eng - angličtina Země vyd. US - Spojené státy americké Klíč. slova pulsed laser deposition ; waveguides ; laser annealing ; rapid thermal annealing Vědní obor RIV BH - Optika, masery a lasery CEZ AV0Z10100522 - FZU-D (2005-2011) Anotace We studied the Eu3+ doped Y2O3 crystalline nanostructures embedded in amorphous alumina waveguides. These samples were prepared by alternating pulsed laser deposition at substrate temperature above 500°C. We proposed to improve on structural properties of the nanocomposite films via a post deposition laser annealing using KrF and XeCl excimer lasers and Rapid Thermal Annealing (RTA) of amorphous nanocomposites elaborated at low substrate temperature. The lasers were chosen due to high absorption of Y2O3 matrix, Eu3+ ions and high transparency for amorphous alumina film. Laser annealing was carried out at various laser power densities, number of laser pulses and oxygen pressures. The RTA was performed by means of pulsed halogen lamp in vacuum and oxygen ambient. The corresponding variations in the structural, fluorescence and optical properties of the Eu:Y2O3/alumina films were measured using XRD, TEM, time resolved fluorescence, spectrophotonic and ellipsometric measurements. Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2010
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