Počet záznamů: 1
Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O.sub.2./sub..sup.+./sup. bombardment
- 1.Franzreb, K. - Williams, P. - Lörinčík, Jan - Šroubek, Zdeněk
Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment.
Applied Surface Science. 203-204, - (2003), s. 39-42. ISSN 0169-4332. E-ISSN 1873-5584
Grant ostatní: KONTAKT National Science Foundation(XE) CHE-0091328
Impakt faktor: 1.284, rok: 2003
http://hdl.handle.net/11104/0003150
Počet záznamů: 1