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Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O.sub.2./sub..sup.+./sup. bombardment
- 1.FRANZREB, K., WILLIAMS, P., LÖRINČÍK, Jan, ŠROUBEK, Zdeněk. Doubly versus singly positively charged oxygen ions back-scattered from a silicon surface under dynamic O2+ bombardment. Applied Surface Science. 2003, 203-204(-), 39-42. ISSN 0169-4332. E-ISSN 1873-5584.
Počet záznamů: 1