Procházková, Olga - Šrobár, Fedor - Jelínek, František - Šaroch, Jaroslav - Žďánský, Karel
Schottky bariers as a diagnostic tool for evaluating properties of InP epitaxial layers prepared from melts containing rare-earth elements.
Piscataway: IEEE, 2000. ISBN 0-7803-5939-9. In: ASDAM 2000. Conference Proceedings of the 3rd International Euro Conference on Advanced Semiconductor Devices and Microsystems. - (Osvald, J.; Haščík, Š.; Kuzmík, J.; Breza, J.), s. 197-199
[ASDAM 2000. Smolenice (SK), 16.10.2000-18.10.2000]
Grant CEP: GA ČR GA102/99/0341
http://hdl.handle.net/11104/0113878