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Noncharging scanning electron microscopy of non-conductors at automatically adjusted critical energies
- 1.Zadražil, M., Frank, L., Müllerová, I. Noncharging scanning electron microscopy of non-conductors at automatically adjusted critical energies. In: BENAVIDES, H. A. C., YACAMÁN, M. J., eds. Proceedings of the 14th International Congress on Electron Microscopy. General Interest and Instrumentation.. Bristol: Institute of Physics Publishing Ltd., 1998, s. 457-458. ISBN 0-7503-0568-1.
Počet záznamů: 1