Characterization of the greep exposed CMSX2 single crystal by neutron diffraction topography and neutron diffractometry

Name: Characterization of the greep exposed CMSX2 single crystal by neutron diffraction topography and neutron diffractometry
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Strunz, Pavel; Lukáš, Petr; Mikula, Pavol; Šaroun, Jan; Albertini, G.; Rustichelli, F.; Cicognani, G.; di Gianfrancesco, A.

Počet záznamů: 1

Characterization of the greep exposed CMSX2 single crystal by neutron diffraction topography and neutron diffractometry

1.

SYSNO	0183407
Název	Characterization of the greep exposed CMSX2 single crystal by neutron diffraction topography and neutron diffractometry
Tvůrce(i)	Strunz, Pavel (UJF-V)_{RID, ORCID, SAI} Lukáš, Petr (UJF-V)_{RID, ORCID, SAI} Mikula, Pavol (UJF-V)_{RID, ORCID, SAI} Šaroun, Jan (UJF-V)_{RID, ORCID, SAI} Albertini, G. (IT) Rustichelli, F. (IT) Cicognani, G. (IT) di Gianfrancesco, A. (IT)
Zdroj.dok.	Czechoslovak Journal of Physics. Roč. 44, - (1994), s. 687-693. - : Springer
Druh dok.	Článek v odborném periodiku
Grant	IAA148404 GA AV ČR - Akademie věd
	GA202/93/0361 GA ČR - Grantová agentura ČR
Jazyk dok.	eng,
Země vyd.	CZ
Trvalý link	http://hdl.handle.net/11104/0001961

Počet záznamů: 1