Počet záznamů: 1
Atomic Surface Characterization and Modification of the Layered Compounds Bi.sub.2./sub.Se.sub.3./sub., Bi.sub.1.9./sub.Sb.sub.0.1./sub.Se.sub.3./sub. and Bi.sub.1.6./sub.Sb.sub.0.4./sub.Se.sub.3./sub..
- 1.0181109 - UFCH-W 20010014 RIV NL eng J - Článek v odborném periodiku
Contera, S. A. - Yoshinobu, T. - Iwasaki, H. - Bastl, Zdeněk - Lošták, P.
Atomic Surface Characterization and Modification of the Layered Compounds Bi2Se3, Bi1.9Sb0.1Se3 and Bi1.6Sb0.4Se3.
Ultramicroscopy. Roč. 86, č. 1 (2001), s. 55-61. ISSN 0304-3991. E-ISSN 1879-2723
Grant ostatní: MESSC(JP) 09CE2005
Výzkumný záměr: CEZ:AV0Z4040901
Klíčová slova: layered materials * scanning tunneling microscopy * atomic surface characterization
Kód oboru RIV: CF - Fyzikální chemie a teoretická chemie
Impakt faktor: 1.890, rok: 2001
Scanning tunneling microscopy(STM) was used to investigate clean surfaces of Bi2Se3, Bi1.9Sb0.1Se3 and Bi1.6Sb0.4Se3 layered crystals. In Bi1.6Sb0.4Se3 sample some atomic sites are brighter than others. This effect is not observed with other samples. Nanoscopic range depressions on the sample might be related to the skeletal crystal structure since the images show atomic corrugation that align in one direction. The results are explained as the effects of the interactions between tip and sample.
Trvalý link: http://hdl.handle.net/11104/0077708
Počet záznamů: 1