Přikryl, P., Černík, M., El-Kader, K. M. A., Ulrych, I., Černý, R., Chvoj, Z., Cháb, V. Time-Resolved Reflectivity Studies of Phase Transition in Polycrystalline Si Induced by Excimer Laser Irradiation. In: PIZZINI, S., ed. Proceedings of Polycrystalline Semiconductors 1995. 1995, s. 41.