Počet záznamů: 1
Measurements of escape probability of photoelectrons and the inelastic mean free path in silver sulphide
- 1.ZEMEK, J., JIŘÍČEK, P., HUCEK, S., LESIAK, B., JABLONSKI, A. Measurements of escape probability of photoelectrons and the inelastic mean free path in silver sulphide. Surface and Interface Analysis. 2000, 30(-), 222-227. ISSN 0142-2421. E-ISSN 1096-9918.
Počet záznamů: 1