MOCEK, T., ROS, D., RUS, B., JOYEUX, D., PRÄG R., A., KOZLOVÁ, M., CARILLON, A., PHALIPPOU, D., BALLESTER, F., JACQUES, E., BOUSSOUKAYA, M., JAMELOT, G. Interferometric probing of thin niobium layers under high electrical field using the zinc X-ray laser at PALS. ISBN 0-7354-0096-2. In: ROCCA, J.J., ed. X-Ray Lasers 2002. Melville: AIP, 2002, s. 518-521. American Institute of Physics Proceedings. ISBN 0-7354-0133. ISSN 0094-243X.