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Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics
- 1.LÁSKA, Leoš, KRÁSA, Josef, STÖCKLI, M. P., FEHRENBACH, C. W. Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics. Review of Scientific Instruments. 2002, 73(2), 776-778. ISSN 0034-6748. E-ISSN 1089-7623.
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