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Recovery stress generation in shape memory Ti.sub.50./sub.Ni.sub.45./sub.Cu.sub.5./sub. thin wires
- 1.ŠITTNER, Petr, VOKOUN, D., DAYANANDA, G. N., STALMANS, R. Recovery stress generation in shape memory Ti50Ni45Cu5 thin wires. Materials Science and Engineering A Structural Materials Properties Microstructure and Processing. 2002, 286(-), 298-311. ISSN 0921-5093. E-ISSN 1873-4936.
Počet záznamů: 1