Fejfar, Antonín - Rezek, Bohuslav - Knápek, Petr - Stuchlík, Jiří - Kočka, Jan
Local electronic transport in microrystalline silicon observed by combined atomic force microscopy.
Journal of Non-Crystalline Solids. 266-269, - (2000), s. 309-314. ISSN 0022-3093. E-ISSN 1873-4812
Grant CEP: GA AV ČR IAA1010809; GA ČR GA202/98/0669
Grant ostatní: JP(XC) NEDO
Impakt faktor: 1.269, rok: 2000
http://hdl.handle.net/11104/0030965