FEJFAR, Antonín, REZEK, Bohuslav, KNÁPEK, Petr, STUCHLÍK, Jiří, KOČKA, Jan. Local electronic transport in microrystalline silicon observed by combined atomic force microscopy. Journal of Non-Crystalline Solids. 2000, 266-269(-), 309-314. ISSN 0022-3093. E-ISSN 1873-4812.