Jiříček, Petr
Measurement of the inelestic mean free path of electrns in copper and copper oxides.
80-227-1010-5. In: New Trends in Surface Analysis. Bratislava: Slovak University of Technology. Faculty of Electrical Engineering and Information Technology. Microelectronics department, 1997 - (Breza, J.; Liday, J.; Frank, L.; Král, J.; Zemek, J.), s. 27-30. Proceedings of the International Seminar.
[NTSA 97 - New Trends in Surface Analysis. Bratislava (SK), 26.11.1997-28.11.1997]
Grant CEP: GA ČR GA202/95/0032
http://hdl.handle.net/11104/0030647