Gemperle, Antonín - Gemperlová, Juliana - Vystavěl, Tomáš
One grain dark field imaging of grain boundary dislocation structures.
Electron Microscpy. Proceedings of the 14th International Congress on Electron Microscopy. Vol. 2. London: Institute of Physics Publishing, 1998 - (Benavides, H.; Yacamán, M.), s. 619-620. ISBN 0-7503-0565-7.
[International Congress on Electron Microscpy (ICEM)/14./. Caucum (MX), 31.08.1998-04.09.1998]
Grant CEP: GA AV ČR IAA1010702; GA ČR GA202/98/1281
http://hdl.handle.net/11104/0030292