Počet záznamů: 1
Voltammetric and X-ray diffraction analysis of the early stages of the thermal crystallization of mixed Cu,Mn oxides
- 1.Grygar, T., Rojka, T., Bezdička, P., Večerníková, E., Kovanda, F. Voltammetric and X-ray diffraction analysis of the early stages of the thermal crystallization of mixed Cu,Mn oxides. Journal of Solid State Electrochemistry. 2004, 8(4), 252-259. ISSN 1432-8488. E-ISSN 1433-0768.
Počet záznamů: 1