Počet záznamů: 1
Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
- 1.Rezek, Bohuslav - Stuchlík, Jiří - Fejfar, Antonín - Kočka, Jan
Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection.
Journal of Applied Physics. Roč. 92, č. 1 (2002), s. 587-593. ISSN 0021-8979. E-ISSN 1089-7550
Grant CEP: GA AV ČR IAA1010809; GA AV ČR IAB2949101; GA ČR GA202/98/0669
Impakt faktor: 2.281, rok: 2002
http://hdl.handle.net/11104/0008021
Počet záznamů: 1