Počet záznamů: 1
Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
- 1.REZEK, Bohuslav, STUCHLÍK, Jiří, FEJFAR, Antonín, KOČKA, Jan. Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection. Journal of Applied Physics. 2002, 92(1), 587-593. ISSN 0021-8979. E-ISSN 1089-7550.
Počet záznamů: 1