Počet záznamů: 1
Silicate glasses doped with Ag+ ions: The comparisSilicate glasses doped with Ag+ ions: The comparison between the ion-exchange and ion implantationon between the ion-exchange and ion implantation
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SYSNO ASEP 0351924 Druh ASEP A - Abstrakt Zařazení RIV Záznam nebyl označen do RIV Zařazení RIV Není vybrán druh dokumentu Název Silicate glasses doped with Ag+ ions: The comparisSilicate glasses doped with Ag+ ions: The comparison between the ion-exchange and ion implantationon between the ion-exchange and ion implantation Tvůrce(i) Švecová, B. (CZ)
Nekvindová, P. (CZ)
Kormunda, M. (CZ)
Macková, Anna (UJF-V) RID, ORCID, SAI
Malinský, Petr (UJF-V) RID, ORCID, SAI
Pešička, J. (CZ)
Špirková, J. (CZ)Celkový počet autorů 7 Zdroj.dok. SSC - Conference on Solid State Chemistry, Book of abstracts. - Praha, 2010 - ISBN 978-80-904678-0-4
S. 139-139Poč.str. 1 s. Akce SSC-Conference on Solid State Chemistry Datum konání 11.09.2010-15.09.2010 Místo konání Praha Země CZ - Česká republika Typ akce CST Jazyk dok. eng - angličtina Klíč. slova Silicate glasses ; Silver ; Ion exchange ; Ion implantation Vědní obor RIV BG - Jaderná, atomová a mol. fyzika, urychlovače CEP GA106/09/0125 GA ČR - Grantová agentura ČR LC06041 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy CEZ AV0Z10480505 - UJF-V (2005-2011) Anotace Silicate glasses containing Ag+ ions have promising optical properties for using in photonic applications. We studied properties of the Ag-doped soda lime-silicate glasses fabricated by the Ag+ ↔ Na+ ion exchange or by the Ag+ ion implantation. Concentration depth profiles of the incoming Ag+ ions were measured by various methods: Rutherford Backscattering Spectrometry, X-ray Photoelectron Spectroscopy, Secondary Ion Mass Spectrometry and Electron Microprobe Analysis. The measured data were compared to the data simulated by SRIM 2008. Waveguiding properties of fabricated samples were measured by Metricon Prism Coupler at different wavelengths. Formation of nanoparticles induced by the post-implantation annealing of the samples, done around transformation temperature of the used glasses for 5 hours, was investigated by Transmission Electron Microscope Analysis. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2011
Počet záznamů: 1