Počet záznamů: 1
Laser-induced electron dynamics and surface modification in ruthenium thin films
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SYSNO ASEP 0582474 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Laser-induced electron dynamics and surface modification in ruthenium thin films Tvůrce(i) Akhmetov, F. (NL)
Milov, I. (NL)
Semin, S. (NL)
Formisano, F. (NL)
Medvedev, Nikita (UFP-V) ORCID
Sturm, J.M. (NL)
Zhakhovsky, V.V. (RU)
Makhotkin, I.A. (NL)
Kimel, A. (NL)
Ackermann, M. (NL)Celkový počet autorů 10 Číslo článku 112045 Zdroj.dok. Vacuum. - : Elsevier - ISSN 0042-207X
Roč. 212, June (2023)Poč.str. 12 s. Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova Femtosecond laser damage ; Fermi smearing ; Pump-probe thermoreflectance ; Ruthenium ; Thin films ; Two-temperature molecular dynamics Vědní obor RIV BL - Fyzika plazmatu a výboje v plynech Obor OECD Fluids and plasma physics (including surface physics) CEP LM2018114 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy LTT17015 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy EF16_013/0001552 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy Způsob publikování Open access Institucionální podpora UFP-V - RVO:61389021 UT WOS 000981025200001 EID SCOPUS 85151528799 DOI 10.1016/j.vacuum.2023.112045 Anotace We performed the experimental and theoretical study of the heating and damaging of ruthenium thin films induced by femtosecond laser irradiation. We present the results of an optical pump-probe thermoreflectance experiment with rotating sample allowing to significantly reduce heat accumulation in irradiated spot. We show the evolution of surface morphology from growth of a heat-induced oxide layer at low and intermediate laser fluences to cracking and grooving at high fluences. Theoretical analysis of thermoreflectance in our pump-probe experiment allows us to relate behavior of hot electrons in ruthenium to the Fermi smearing mechanism. This conclusion invites more research on Fermi smearing of transition metals. The analysis of heating is performed with the two-temperature modeling and molecular dynamics simulation, results of which demonstrate that the calculated single-shot melting threshold is higher than experimental damage threshold. We suggest that the onset of Ru film damage is caused by the heat-induced stresses that lead to cracking of the Ru film. Such damage accumulates during repetitive exposure to light. Pracoviště Ústav fyziky plazmatu Kontakt Vladimíra Kebza, kebza@ipp.cas.cz, Tel.: 266 052 975 Rok sběru 2024 Elektronická adresa https://www.sciencedirect.com/science/article/pii/S0042207X23002427?via%3Dihub
Počet záznamů: 1