Počet záznamů: 1
Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition
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SYSNO ASEP 0378662 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Structural characterization of ZnO thin films grown on various substrates by pulsed laser deposition Tvůrce(i) Novotný, Michal (FZU-D) RID, ORCID, SAI
Čížek, J. (CZ)
Kužel, R. (CZ)
Bulíř, Jiří (FZU-D) RID, ORCID, SAI
Lančok, Ján (FZU-D) RID, ORCID
Connolly, J. (IE)
McCarthy, E. (IE)
Krishnamurthy, S. (IE)
Mosnier, J.-P. (IE)
Anwand, W. (DE)
Brauer, G. (DE)Zdroj.dok. Journal of Physics D-Applied Physics. - : Institute of Physics Publishing - ISSN 0022-3727
Roč. 45, č. 22 (2012), 1-12Poč.str. 12 s. Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova ZnO thin film ; pulsed laser deposition ; x-ray diffraction positron implantation spectroscopy Vědní obor RIV BM - Fyzika pevných látek a magnetismus CEP GAP108/11/0958 GA ČR - Grantová agentura ČR GP202/09/P324 GA ČR - Grantová agentura ČR CEZ AV0Z10100522 - FZU-D (2005-2011) UT WOS 000305175100003 DOI 10.1088/0022-3727/45/22/225101 Anotace ZnO thin films were grown by pulsed laser deposition on three different substrates: sapphire (0 0 0 1), MgO (1 0 0) and fused silica (FS). The structure and morphology of the films were characterized by x-ray diffraction and scanning electron microscopy and defect studies were carried out using slow positron implantation spectroscopy (SPIS). Films deposited on all substrates studied in this work exhibit the wurtzite ZnO structure and are characterized by an average crystallite size of 20-100 nm. However, strong differences in the microstructure of films deposited on various substrates were found. The ZnO films deposited on MgO and sapphire single-crystalline substrates exhibit local epitaxy, i.e. a well-defined relation between film crystallites and the substrate. Domains with different orientation relationships with the substrate were found in both films. On the other hand, the film deposited on the FS substrate exhibits fibre texture with random lateral orientation ... Pracoviště Fyzikální ústav Kontakt Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Rok sběru 2013
Počet záznamů: 1