The first experience with the specimen preparation for low-voltage transmission electron microscope
1.
SYSNO ASEP
0157595
Druh ASEP
C - Konferenční příspěvek (mezinárodní konf.)
Zařazení RIV
Záznam nebyl označen do RIV
Název
The first experience with the specimen preparation for low-voltage transmission electron microscope
Tvůrce(i)
Nebesářová, Jana (PAU-O) Vancová, Marie (PAU-O)
Zdroj.dok.
Microscopy 2002. Proceedings of the 2nd (re-established) Annual Meeting of the Czechoslovak Microscopy Society, held on February 8 to 9, 2002 in Hotel Club, Vranovská ves near Znojmo / Frank L.. - Brno : Graphical Brno, 2002
- ISBN 80-238-8749-1
Rozsah stran
s. 35-36
Poč.str.
2 s.
Akce
Annual Meeting of the Czechoslovak Microscopy Society /2./
Datum konání
08.02.2002-09.02.2002
Místo konání
Vranovská ves
Země
CZ - Česká republika
Typ akce
EUR
Jazyk dok.
eng - angličtina
Země vyd.
CZ - Česká republika
Klíč. slova
specimen preparation ; low-voltage transmission electron microscopy
Vědní obor RIV
EA - Morfologické obory a cytologie
CEZ
AV0Z6022909 - PAU-O, BC-A
Anotace
The low-voltage transmission electron microscope, working in the TEM mode, requires ultrathin sections with a thickness 20-30nm. This demand brings problems with a section cohesion caused by insufficient resin infiltration and with a chatter caused by unequal thickness of the section. The contrast of unstained biological specimens in LV TEM is comparable with the contrast obtained in HV TEM of stained specimens.
