Počet záznamů: 1
Escape probability of 0 1s photoelectrons leaving aluminium oxide
- 1.ZEMEK, J., HUCEK, S., JABLONSKI, A., TILININ, I. S. Escape probability of 0 1s photoelectrons leaving aluminium oxide. In: OLEFJORD, I., NYBORG, L., BRIGGS, D., eds. Proceedings of European Conference on Applied Surface and Interface Analysis- ECASIA 97. Chichester: John Wiley and Sons, Ltd., 1997, s. 840-843.
Počet záznamů: 1