Počet záznamů: 1
The Dopant Contrast – A Challenge to Electron Microscopy
- 1.Frank, Luděk
The Dopant Contrast – A Challenge to Electron Microscopy.
Proceedings of the 10th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Brno: ISI AS CR, 2006 - (Müllerová, I.), s. 19-22. ISBN 80-239-6285-X.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /10./. Skalský dvůr (CZ), 22.05.2006-26.05.2006]
http://hdl.handle.net/11104/0139506
Počet záznamů: 1