Počet záznamů: 1
Optical and scanning electron microscopies in examination of ultrathin foils
- 1.Konvalina, Ivo - Hovorka, Miloš - Fořt, Tomáš - Müllerová, Ilona
Optical and scanning electron microscopies in examination of ultrathin foils.
Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010. s. 224.
[Focus on Microscopy - FOM 2010. 28.03.2010-31.03.2010, Shanghai]
http://hdl.handle.net/11104/0192399
Počet záznamů: 1