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Optical and scanning electron microscopies in examination of ultrathin foils
- 1.KONVALINA, I., HOVORKA, M., FOŘT, T., MÜLLEROVÁ, I. Optical and scanning electron microscopies in examination of ultrathin foils. In: Focus on Microscopy - FOM 2010. Shanghai: Shanghai Jiao Tong University, 2010, s. 224.
Počet záznamů: 1