Surface roughness effect on Mo physical sputtering and re-deposition in the linear plasma device PSI-2 predicted by ERO2.0

EKSAEVA, A., BORODIN, D., ROMAZANOV, J., KIRSCHNER, A., KRETER, A., EICHLER, M., RASINSKI, M., POSPIESZCZYK, A., UNTERBERG, B., BREZINSEK, S., LINSMEIER, Ch., TSKHAKAYA, D., BORODKINA, I., KOMM, Michael. Surface roughness effect on Mo physical sputtering and re-deposition in the linear plasma device PSI-2 predicted by ERO2.0. Nuclear Materials and Energy. 2019, 19(May 2019), 13-18. E-ISSN 2352-1791. Dostupné z: doi: 10.1016/j.nme.2019.02.006.