Počet záznamů: 1
Residual stress determination by the layer removal and X-ray diffraction measurement correction method
- 1.DLHÝ, Pavol, PODUŠKA, Jan, POKORNÝ, Pavel, JAMBOR, Michal, NÁHLÍK, Luboš, HUTAŘ, Pavel. Residual stress determination by the layer removal and X-ray diffraction measurement correction method. MethodsX. 2022, 9(neuvedeno), 101768. E-ISSN 2215-0161. Dostupné z: doi: 10.1016/j.mex.2022.101768.
Počet záznamů: 1