Počet záznamů: 1
Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction
- 1.HLUSHKO, K., MACKOVÁ, Anna, ZÁLEŠÁK, J., BURGHAMMER, M., DAVYDOK, A., KRYWKA, C., DANIEL, R., KECKES, J., TODT, J. Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction. Thin Solid Films. 2021, 722(MAR), 138571. ISSN 0040-6090. E-ISSN 1879-2731. Dostupné z: doi: 10.1016/j.tsf.2021.138571.
Počet záznamů: 1