Počet záznamů: 1
Field Emission Properties of Polymer Graphite Tips Prepared by Membrane Electrochemical Etching
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SYSNO ASEP 0531987 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Field Emission Properties of Polymer Graphite Tips Prepared by Membrane Electrochemical Etching Tvůrce(i) Knápek, Alexandr (UPT-D) RID, ORCID, SAI
Dallaev, R. (CZ)
Burda, Daniel (UPT-D)
Sobola, D. (CZ)
Allaham, M. M. (JO)
Horáček, Miroslav (UPT-D) RID, ORCID, SAI
Kašpar, P. (CZ)
Matějka, Milan (UPT-D) RID, ORCID, SAI
Mousa, M. S. (JO)Celkový počet autorů 9 Číslo článku 1294 Zdroj.dok. Nanomaterials. - : MDPI
Roč. 10, č. 7 (2020)Poč.str. 12 s. Forma vydání Tištěná - P Jazyk dok. eng - angličtina Země vyd. CH - Švýcarsko Klíč. slova polymer graphite tip ; electrochemical etching ; field emission microscopy Vědní obor RIV BH - Optika, masery a lasery Obor OECD Condensed matter physics (including formerly solid state physics, supercond.) CEP VI20192022147 GA MV - Ministerstvo vnitra Způsob publikování Open access Institucionální podpora UPT-D - RVO:68081731 UT WOS 000554791000001 EID SCOPUS 85087397947 DOI 10.3390/nano10071294 Anotace This paper investigates field emission behavior from the surface of a tip that was prepared from polymer graphite nanocomposites subjected to electrochemical etching. The essence of the tip preparation is to create a membrane of etchant over an electrode metal ring. The graphite rod acts here as an anode and immerses into the membrane filled with alkali etchant. After the etching process, the tip is cleaned and analyzed by Raman spectroscopy, investigating the chemical composition of the tip. The topography information is obtained using the Scanning Electron Microscopy and by Field Emission Microscopy. The evaluation and characterization of field emission behavior is performed at ultra-high vacuum conditions using the Field Emission Microscopy where both the field electron emission pattern projected on the screen and current-voltage characteristics are recorded. The latter is an essential tool that is used both for the imaging of the tip surfaces by electrons that are emitted toward the screen, as well as a tool for measuring current-voltage characteristics that are the input to test field emission orthodoxy. Pracoviště Ústav přístrojové techniky Kontakt Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Rok sběru 2021 Elektronická adresa https://www.mdpi.com/2079-4991/10/7/1294
Počet záznamů: 1