Počet záznamů: 1
Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold
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$a 10.1364/JOSAB.35.002799 $2 DOI 100 $a 20190322d m y slo 03 ba 101 $a eng $d eng 102 $a US 200 1-
$a Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold 215 $a 7 s. 300 $a dvojí afiliace 463 -1
$1 001 cav_un_epca*0257145 $1 011 $a 0740-3224 $e 1520-8540 $1 200 1 $a Journal of the Optical Society of America. B $v Roč. 35, č. 11 (2018), s. 2799-2805 $1 210 $c Optical Society of America 608 $a Article 610 $a interaction of femtosecond XUV pulses 610 $a single-shot ablation threshold 610 $a damage accumulation in thin ruthenium films 700 -1
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Počet záznamů: 1