Počet záznamů: 1
Focusing and reflectivity properties of a parallel double bent crystal ( plus n,-m) setting
- 1.
SYSNO ASEP 0433182 Druh ASEP C - Konferenční příspěvek (mezinárodní konf.) Zařazení RIV D - Článek ve sborníku Název Focusing and reflectivity properties of a parallel double bent crystal ( plus n,-m) setting Tvůrce(i) Mikula, Pavol (UJF-V) RID, ORCID, SAI
Vrána, Miroslav (UJF-V) RID
Pilch, Jan (UJF-V) RID
Šaroun, Jan (UJF-V) RID, ORCID, SAI
Seong, B. S. (KR)
Woo, C. (KR)
Em, V. (KR)Celkový počet autorů 7 Zdroj.dok. Journal of Physics Conference Series, 528 - International Workshop on Neutron Optics and Detectors (NOP&D 2013). - Bristol : IOP Publishing Ltd, 2014 / Ioffe A. - ISSN 1742-6588 Rozsah stran 012003 Poč.str. 8 s. Forma vydání Tištěná - P Akce International Workshop on Neutron Optics and Detectors (NOP&D 2013) Datum konání 02.07.2013-05.07.2013 Místo konání Munich Země DE - Německo Typ akce WRD Jazyk dok. eng - angličtina Země vyd. GB - Velká Británie Klíč. slova double bent crystal ; diffrraction ; monochromator Vědní obor RIV BM - Fyzika pevných látek a magnetismus CEP LM2011019 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy GB14-36566G GA ČR - Grantová agentura ČR LM2010011 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy Institucionální podpora UJF-V - RVO:61389005 UT WOS 000340245000003 DOI 10.1088/1742-6596/528/1/012003 Anotace After preliminary results obtained and published recently ill, in our contribution focusing and reflectivity properties of the dispersive double bent-crystal arrangement are presented in much more detail. It has been found that two different bent perfect crystals in (+n,-m) setting can be good candidates for high efficiency neutron microfocusing as well as high-resolution monochromatisation. Due to the (+n,-m) setting of two different bent perfect crystals, a high resolution is expected in both Delta(2 theta) (2 theta is the scattering angle) as well as Delta lambda/lambda (lambda is the neutron wavelength). Experimental tests were carried out with the setting employing the bent Si(111) slab and Si(220)-sandwich, which contained either one, or two or four 1.3 mm thin simply stacked slabs. Thanks to a high reflection probability of both bent elements and an easy manipulation with the curvature of the Si(220)-sandwich, an excellently focused intensive monochromatic beam of the width from one to several millimetres was obtained. The properties of the double bent-crystal setting were studied in Rez at the neutron optics diffractometer for the neutron wavelength of 0.162 nm and for various thicknesses and curvatures of the Si(220)-sandwich. It has been also found that besides an excellent focusing and reflectivity properties of the dispersive double bent-crystal setting the obtained monochromatic neutron current is sufficiently high for standard high-resolution diffraction experiments even at the medium power research reactor. Pracoviště Ústav jaderné fyziky Kontakt Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Rok sběru 2015
Počet záznamů: 1