Počet záznamů: 1
Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride
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SYSNO ASEP 0582247 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride Tvůrce(i) Tkachenko, V. (PL)
Lipp, V. (DE)
Buescher, M. (DE)
Capotondi, F. (IT)
Hoeppner, H. (DE)
Medvedev, Nikita (UFP-V) ORCID
Pedersoli, E. (IT)
Prandolini, M.J. (DE)
Rossi, G.M. (DE)
Tavella, F. (US)
Toleikis, S. (DE)
Windeler, M. (US)
Ziaja, B. (DE)
Teubner, U. (DE)Celkový počet autorů 14 Číslo článku 5203 Zdroj.dok. Scientific Reports. - : Nature Publishing Group - ISSN 2045-2322
Roč. 11, č. 1 (2021)Poč.str. 10 s. Jazyk dok. eng - angličtina Země vyd. US - Spojené státy americké Klíč. slova XUV ; X-ray ; silicon nitride Vědní obor RIV BH - Optika, masery a lasery Obor OECD Optics (including laser optics and quantum optics) CEP LTT17015 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy EF16_013/0001552 GA MŠMT - Ministerstvo školství, mládeže a tělovýchovy Způsob publikování Omezený přístup Institucionální podpora UFP-V - RVO:61389021 UT WOS 000626140000031 EID SCOPUS 85102084539 DOI 10.1038/s41598-021-84677-w Anotace Spatially encoded measurements of transient optical transmissivity became a standard tool for temporal diagnostics of free-electron-laser (FEL) pulses, as well as for the arrival time measurements in X-ray pump and optical probe experiments. The modern experimental techniques can measure changes in optical coefficients with a temporal resolution better than 10 fs. This, in an ideal case, would imply a similar resolution for the temporal pulse properties and the arrival time jitter between the FEL and optical laser pulses. However, carrier transport within the material and out of its surface, as well as carrier recombination may, in addition, significantly decrease the number of carriers. This would strongly affect the transient optical properties, making the diagnostic measurement inaccurate. Below we analyze in detail the effects of those processes on the optical properties of XUV and soft X-ray irradiated Si3N4, on sub-picosecond timescales. Si3N4 is a wide-gap insulating material widely used for FEL pulse diagnostics. Theoretical predictions are compared with the published results of two experiments at FERMI and LCLS facilities, and with our own recent measurement. The comparison indicates that three body Auger recombination strongly affects the optical response of Si3N4 after its collisional ionization stops. By deconvolving the contribution of Auger recombination, in future applications one could regain a high temporal resolution for the reconstruction of the FEL pulse properties measured with a Si3N4-based diagnostics tool. Pracoviště Ústav fyziky plazmatu Kontakt Vladimíra Kebza, kebza@ipp.cas.cz, Tel.: 266 052 975 Rok sběru 2024 Elektronická adresa https://www.nature.com/articles/s41598-021-84677-w
Počet záznamů: 1