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Spectral Dependencies of the Stretched Exponential Dispersion Factor and Photoluminescence Quantum Yield as a Common Feature of Nanocrystalline Si
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SYSNO ASEP 0540637 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Spectral Dependencies of the Stretched Exponential Dispersion Factor and Photoluminescence Quantum Yield as a Common Feature of Nanocrystalline Si Tvůrce(i) Greben, M. (CZ)
Khoroshyy, Petro (MBU-M) ORCID
Valenta, J. (CZ)Číslo článku 1900698 Zdroj.dok. Physica Status Solidi A : Applications and Materials Science. - : Wiley - ISSN 1862-6300
Roč. 217, č. 4 (2020)Poč.str. 12 s. Jazyk dok. eng - angličtina Země vyd. DE - Německo Klíč. slova dispersion factors ; quantum yield ; rate/lifetime distribution ; silicon nanocrystals ; stretched exponential functions Obor OECD Biophysics Způsob publikování Omezený přístup Institucionální podpora MBU-M - RVO:61388971 UT WOS 000503019200001 EID SCOPUS 85076765581 DOI 10.1002/pssa.201900698 Anotace Herein, the spectral dependencies of the dispersion factor Beta (from the stretched exponential function) and photoluminescence (PL) quantum yield (QY) of silicon nanocrystals (Si NCs) are thoroughly studied. Spectrally resolved PL decay kinetics of Si NCs in both liquid and solid samples are measured and their corresponding distributions of rates are retrieved by means of the hybrid maximum-entropy method. This enables us to demonstrate a direct correlation of dispersion factor β with the width of rate distribution. Here, the evidence of the same step-like spectral dependence of rate distribution widths (dispersion factor) for different forms of nanocrystalline silicon (including porous silicon and chemically synthesized Si NCs) is presented suggesting intrinsic (core-related) origin of rate distributions. Spectral dependence of normalized QY of Si NCs reveals two characteristic peaks with spectral positions at ≈1.42 and ≈1.68 eV. A similar peak in QY spectral dependence of CdSe quantum dots (QDs) is found, which suggests its common origin regardless the material of semiconductor QDs. Pracoviště Mikrobiologický ústav Kontakt Eliška Spurná, eliska.spurna@biomed.cas.cz, Tel.: 241 062 231 Rok sběru 2021 Elektronická adresa https://onlinelibrary.wiley.com/doi/abs/10.1002/pssa.201900698
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