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Thickness determination of a cathodoluminescence active nanoparticles by means of Quantitative STEM imaging
SYS 0494375 LBL 01000a^^22220027750^450 005 20240103220623.8 014 $a 000450591400029 $2 WOS 017 $2 DOI 100 $a 20181011d m y slo 03 ba 101 $a eng $d eng 102 $a CZ 200 1-
$a Thickness determination of a cathodoluminescence active nanoparticles by means of Quantitative STEM imaging 215 $a 3 s. $c P 463 -1
$1 001 cav_un_epca*0494358 $1 010 $a 978-80-87441-23-7 $1 200 1 $a Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar $v S. 74-76 $1 210 $a Brno $c Institute of Scientific Instruments The Czech Academy of Sciences $d 2018 610 $a quantitative imaging 610 $a Monte Carlo 700 -1
$3 cav_un_auth*0323997 $a Skoupý $b Radim $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $p UPT-D $w Electron Microscopy $z K $T Ústav přístrojové techniky AV ČR, v. v. i. 701 -1
$3 cav_un_auth*0286053 $a Krzyžánek $b Vladislav $i D1: Elektronová mikroskopie $j D1: Electron Microscopy $p UPT-D $w Electron Microscopy $T Ústav přístrojové techniky AV ČR, v. v. i.
Počet záznamů: 1