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Optical Properties of Titania Coatings Prepared by Inkjet Direct Patterning of a Reverse Micelles Sol-Gel Composition.
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SYSNO ASEP 0457723 Druh ASEP J - Článek v odborném periodiku Zařazení RIV J - Článek v odborném periodiku Poddruh J Článek ve WOS Název Optical Properties of Titania Coatings Prepared by Inkjet Direct Patterning of a Reverse Micelles Sol-Gel Composition. Tvůrce(i) Schmiedová, V. (CZ)
Dzik, P. (CZ)
Veselý, M. (CZ)
Zmeškal, O. (CZ)
Morozová, Magdalena (UCHP-M) RID, SAI
Klusoň, Petr (UCHP-M) RID, ORCID, SAIZdroj.dok. Molecules. - : MDPI
Roč. 20, č. 8 (2015), s. 14552-14564Poč.str. 13 s. Jazyk dok. eng - angličtina Země vyd. CH - Švýcarsko Klíč. slova material printing ; inkjet ; ellipsometry Vědní obor RIV CI - Průmyslová chemie a chemické inženýrství CEP TA03010548 GA TA ČR - Technologická agentura ČR FR-TI1/144 GA MPO - Ministerstvo průmyslu a obchodu Institucionální podpora UCHP-M - RVO:67985858 UT WOS 000361375400063 EID SCOPUS 84941243749 DOI 10.3390/molecules200814552 Anotace Thin layers of titanium dioxide were fabricated by direct inkjet patterning of a reverse micelles sol-gel composition onto soda-lime glass plates. Several series of variable thickness samples were produced by repeated overprinting and these were further calcined at different temperatures. The resulting layers were inspected by optical and scanning electronic microscopy and their optical properties were investigated by spectroscopic ellipsometry in the range of 200-1000 nm. Thus the influence of the calcination temperature on material as well as optical properties of the patterned micellar titania was studied. The additive nature of the deposition process was demonstrated by a linear dependence of total thickness on the number of printed layers without being significantly affected by the calcination temperature. The micellar imprints structure of the titania layer resulted into significant deviation of measured optical constants from the values reported for bulk titania. The introduction of a void layer into the ellipsometric model was found necessary for this particular type of titania and enabled correct ellipsometric determination of layer thickness, well matching the thickness values from mechanical profilometry. Pracoviště Ústav chemických procesů Kontakt Eva Jirsová, jirsova@icpf.cas.cz, Tel.: 220 390 227 Rok sběru 2016
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