Počet záznamů: 1
In situ XPS characterization of diamond films after AR.sup.+./sup. cluster ion beam sputtering
- 1.Artemenko, Anna - Babchenko, Oleg - Kozak, Halyna - Ukraintsev, Egor - Ižák, Tibor - Romanyuk, Olexandr - Potocký, Štěpán - Kromka, Alexander
In situ XPS characterization of diamond films after AR+ cluster ion beam sputtering.
NANOCON 2015: 7th International Conference on Nanomaterials - Research and Application, Conference Proceedings. Ostrava: TANGER, spol. s r.o., 2015, s. 605-610. ISBN 978-80-87294-63-5.
[NANOCON 2015. International Conference /7./. Brno (CZ), 14.10.2015-16.10.2015]
Obor OECD: Condensed matter physics (including formerly solid state physics, supercond.)
http://hdl.handle.net/11104/0253621
Počet záznamů: 1