Počet záznamů: 1
In situ XPS characterization of diamond films after AR.sup.+./sup. cluster ion beam sputtering
- 1.Artemenko, A., Babchenko, O., Kozak, H., Ukraintsev, E., Ižák, T., Romanyuk, O., Potocký, Š., Kromka, A. In situ XPS characterization of diamond films after AR+ cluster ion beam sputtering. In: NANOCON 2015: 7th International Conference on Nanomaterials - Research and Application, Conference Proceedings. Ostrava: TANGER, spol. s r.o., 2015, s. 605-610. ISBN 978-80-87294-63-5.
Počet záznamů: 1